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1 Ergebnisse
1
Low-Complexity Double-Node-Upset Resilient Latch Design Usi..:
Kang, Young-Min
;
Park, Jung-Jin
;
Kim, Geon-Hak
..
IEEE Transactions on Circuits and Systems II: Express Briefs. 70 (2023) 9 - p. 3619-3623 , 2023
Link:
https://doi.org/10.1109/tcsii.2023.3266489
RT Journal T1 <Title>Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsii.2023.3266489&Exemplar=1&LAN=DE A1 Kang, Young-Min A1 Park, Jung-Jin A1 Kim, Geon-Hak A1 Chang, Ik-Joon A1 Kim, Jinsang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1549-7747 SN 1558-3791 JF IEEE Transactions on Circuits and Systems II: Express Briefs VO 70 IS 9 SP 3619 OP 3623 LK http://dx.doi.org/https://doi.org/10.1109/tcsii.2023.3266489 DO https://doi.org/10.1109/tcsii.2023.3266489 SF ELIB - SuUB Bremen
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