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Double-Node-Upset Self-Recoverable Latch Design for Wide Vo..:

Bai, Yuxin ; Chen, Xin ; Zhou, Xinjie..
IEEE Transactions on Circuits and Systems II: Express Briefs.  71 (2024)  3 - p. 1411-1415 , 2024
Link: https://doi.org/10.1109/tcsii.2023.3324006