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1 Ergebnisse
1
Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diag..:
Lim, Hyeonchan
;
Kim, Taehyun
;
Kang, Sungho
IEEE Transactions on Circuits and Systems II: Express Briefs. 71 (2024) 4 - p. 2024-2028 , 2024
Link:
https://doi.org/10.1109/tcsii.2023.3332082
RT Journal T1 <Title>Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsii.2023.3332082&Exemplar=1&LAN=DE A1 Lim, Hyeonchan A1 Kim, Taehyun A1 Kang, Sungho PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-7747 SN 1558-3791 JF IEEE Transactions on Circuits and Systems II: Express Briefs VO 71 IS 4 SP 2024 OP 2028 LK http://dx.doi.org/https://doi.org/10.1109/tcsii.2023.3332082 DO https://doi.org/10.1109/tcsii.2023.3332082 SF ELIB - SuUB Bremen
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