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1 Ergebnisse
1
A TDC With Integrated Snapshot Circuit and Calibration in 2..:
Lauber, Tim
;
Wang, Lantao
;
Bastl, Johannes
...
IEEE Transactions on Circuits and Systems II: Express Briefs. 71 (2024) 3 - p. 1581-1585 , 2024
Link:
https://doi.org/10.1109/tcsii.2023.3343470
RT Journal T1 <Title>A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tcsii.2023.3343470&Exemplar=1&LAN=DE A1 Lauber, Tim A1 Wang, Lantao A1 Bastl, Johannes A1 Vohl, Kenny A1 Wunderlich, Ralf A1 Heinen, Stefan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1549-7747 SN 1558-3791 JF IEEE Transactions on Circuits and Systems II: Express Briefs VO 71 IS 3 SP 1581 OP 1585 LK http://dx.doi.org/https://doi.org/10.1109/tcsii.2023.3343470 DO https://doi.org/10.1109/tcsii.2023.3343470 SF ELIB - SuUB Bremen
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