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A Novel Deep-Learning Framework to Identify and Locate Sing..:
Das, Rakesh
;
Das, Arup K.
;
Chatterjee, Soumya
...
IEEE Transactions on Dielectrics and Electrical Insulation. 30 (2023) 6 - p. 2633-2641 , 2023
Link:
https://doi.org/10.1109/tdei.2023.3289482
RT Journal T1 <Title>A Novel Deep-Learning Framework to Identify and Locate Single and Multiple Partial Discharge Events</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdei.2023.3289482&Exemplar=1&LAN=DE A1 Das, Rakesh A1 Das, Arup K. A1 Chatterjee, Soumya A1 Pradhan, Arpan K. A1 Biswas, Subrata A1 Dalai, Sovan A1 Chatterjee, Biswendu A1 Bhattacharya, Kesab PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1070-9878 SN 1558-4135 JF IEEE Transactions on Dielectrics and Electrical Insulation VO 30 IS 6 SP 2633 OP 2641 LK http://dx.doi.org/https://doi.org/10.1109/tdei.2023.3289482 DO https://doi.org/10.1109/tdei.2023.3289482 SF ELIB - SuUB Bremen
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