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1 Ergebnisse
1
Prebreakdown Evolution of Field Emission-Induced Breakdown ..:
Li, Shimin
;
Jiang, Xixi
;
Zhang, Chaohai
IEEE Transactions on Dielectrics and Electrical Insulation. 31 (2024) 1 - p. 222-229 , 2024
Link:
https://doi.org/10.1109/tdei.2023.3318211
RT Journal T1 <Title>Prebreakdown Evolution of Field Emission-Induced Breakdown Under Impulse Voltage</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdei.2023.3318211&Exemplar=1&LAN=DE A1 Li, Shimin A1 Jiang, Xixi A1 Zhang, Chaohai PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1070-9878 SN 1558-4135 JF IEEE Transactions on Dielectrics and Electrical Insulation VO 31 IS 1 SP 222 OP 229 LK http://dx.doi.org/https://doi.org/10.1109/tdei.2023.3318211 DO https://doi.org/10.1109/tdei.2023.3318211 SF ELIB - SuUB Bremen
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