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1 Ergebnisse
1
Investigating Dielectric Relaxation Currents for a Deeper U..:
Han, Dong Hee
;
Choi, Su Jin
;
Kim, Youngjin
.
IEEE Transactions on Dielectrics and Electrical Insulation. 31 (2024) 3 - p. 1276-1280 , 2024
Link:
https://doi.org/10.1109/tdei.2023.3342759
RT Journal T1 <Title>Investigating Dielectric Relaxation Currents for a Deeper Understanding of Capacitance and Interface in Metal–Insulator–Metal Capacitor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdei.2023.3342759&Exemplar=1&LAN=DE A1 Han, Dong Hee A1 Choi, Su Jin A1 Kim, Youngjin A1 Jeon, Woojin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1070-9878 SN 1558-4135 JF IEEE Transactions on Dielectrics and Electrical Insulation VO 31 IS 3 SP 1276 OP 1280 LK http://dx.doi.org/https://doi.org/10.1109/tdei.2023.3342759 DO https://doi.org/10.1109/tdei.2023.3342759 SF ELIB - SuUB Bremen
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