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1 Ergebnisse
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Surface Defect Detection of GIS Aramid Insulation Pull Rod ..:
Luo, Hanhua
;
Fan, Xianhao
;
Liang, Fangwei
...
IEEE Transactions on Dielectrics and Electrical Insulation. 31 (2024) 4 - p. 1772-1777 , 2024
Link:
https://doi.org/10.1109/tdei.2024.3370130
RT Journal T1 <Title>Surface Defect Detection of GIS Aramid Insulation Pull Rod via Photon Counting</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdei.2024.3370130&Exemplar=1&LAN=DE A1 Luo, Hanhua A1 Fan, Xianhao A1 Liang, Fangwei A1 Hu, Jun A1 Yan, Bingyue A1 Li, Tengfei A1 He, Jinliang A1 Li, Chuanyang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1070-9878 SN 1558-4135 JF IEEE Transactions on Dielectrics and Electrical Insulation VO 31 IS 4 SP 1772 OP 1777 LK http://dx.doi.org/https://doi.org/10.1109/tdei.2024.3370130 DO https://doi.org/10.1109/tdei.2024.3370130 SF ELIB - SuUB Bremen
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