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1 Ergebnisse
1
Insulation Degradation Characteristics and Phase-Field Simu..:
Shang, Gaoyi
;
Liu, Xuandong
;
Shao, Yuhang
...
IEEE Transactions on Dielectrics and Electrical Insulation. 31 (2024) 2 - p. 615-624 , 2024
Link:
https://doi.org/10.1109/tdei.2024.3375804
RT Journal T1 <Title>Insulation Degradation Characteristics and Phase-Field Simulation of Epoxy Resin for Valve-Side Bushing Under Strongly Coupled Electrothermal Field</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdei.2024.3375804&Exemplar=1&LAN=DE A1 Shang, Gaoyi A1 Liu, Xuandong A1 Shao, Yuhang A1 Chen, Ming A1 Sun, Yingman A1 Zhang, Qiaogen A1 Tang, Hao A1 Li, Xining PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1070-9878 SN 1558-4135 JF IEEE Transactions on Dielectrics and Electrical Insulation VO 31 IS 2 SP 615 OP 624 LK http://dx.doi.org/https://doi.org/10.1109/tdei.2024.3375804 DO https://doi.org/10.1109/tdei.2024.3375804 SF ELIB - SuUB Bremen
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