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A Comparison of Electron, Proton and Gamma Irradiation Effe..:
Hegde, Vinayakprasanna N.
;
Pradeep, T. M.
;
Pushpa, N.
...
IEEE Transactions on Device and Materials Reliability. 18 (2018) 4 - p. 592-598 , 2018
Link:
https://doi.org/10.1109/tdmr.2018.2875064
RT Journal T1 <Title>A Comparison of Electron, Proton and Gamma Irradiation Effects on the I-V Characteristics of 200 GHz SiGe HBTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2018.2875064&Exemplar=1&LAN=DE A1 Hegde, Vinayakprasanna N. A1 Pradeep, T. M. A1 Pushpa, N. A1 Praveen, K. C. A1 Bhushan, K. G. A1 Cressler, J. D. A1 Gnana Prakash, A. P. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2018 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 18 IS 4 SP 592 OP 598 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2018.2875064 DO https://doi.org/10.1109/tdmr.2018.2875064 SF ELIB - SuUB Bremen
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