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1 Ergebnisse
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The Impact of the Electrode Performance on the Endurance Pr..:
Lu, Y. Y.
;
Cai, D. L.
;
Chen, Y. F.
...
IEEE Transactions on Device and Materials Reliability. 19 (2019) 1 - p. 164-168 , 2019
Link:
https://doi.org/10.1109/tdmr.2019.2893770
RT Journal T1
The Impact of the Electrode Performance on the Endurance Properties of the Phase Change Memory Device
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2019.2893770&Exemplar=1&LAN=DE A1 Lu, Y. Y. A1 Cai, D. L. A1 Chen, Y. F. A1 Zheng, Y. H. A1 Yan, S. A1 Wu, L. A1 Liu, Y. G. A1 Li, Y. A1 Song, Z. T. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 19 IS 1 SP 164 OP 168 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2019.2893770 DO https://doi.org/10.1109/tdmr.2019.2893770 SF ELIB - SuUB Bremen
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