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A Comprehensive Study of Total Ionizing Dose Effect on the ..:
Yang, Chih Yi
;
Chung, Chin Han
;
Yu, Wei
...
IEEE Transactions on Device and Materials Reliability. 22 (2022) 2 - p. 276-281 , 2022
Link:
https://doi.org/10.1109/tdmr.2022.3173000
RT Journal T1 <Title>A Comprehensive Study of Total Ionizing Dose Effect on the Electrical Performance of the GaN MIS-HEMT</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2022.3173000&Exemplar=1&LAN=DE A1 Yang, Chih Yi A1 Chung, Chin Han A1 Yu, Wei A1 Ma, Cheng Jun A1 Wu, Sih Rong A1 Dixit, Abhisek A1 Lee, Ching Ting A1 Chang, Edward Yi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 22 IS 2 SP 276 OP 281 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2022.3173000 DO https://doi.org/10.1109/tdmr.2022.3173000 SF ELIB - SuUB Bremen
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