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Reliable Circuit Design Using a Fast Incremental-Based Gate..:

Ghavami, Behnam ; Raji, Mohsen ; Ibrami, Milad.
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 371-380 , 2022
Link: https://doi.org/10.1109/tdmr.2022.3175914