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1 Ergebnisse
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Low Conductance State Drift Characterization and Mitigation..:
Baroni, Andrea
;
Glukhov, Artem
;
Perez, Eduardo
...
IEEE Transactions on Device and Materials Reliability. 22 (2022) 3 - p. 340-347 , 2022
Link:
https://doi.org/10.1109/tdmr.2022.3182133
RT Journal T1 <Title>Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2022.3182133&Exemplar=1&LAN=DE A1 Baroni, Andrea A1 Glukhov, Artem A1 Perez, Eduardo A1 Wenger, Christian A1 Ielmini, Daniele A1 Olivo, Piero A1 Zambelli, Cristian PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 22 IS 3 SP 340 OP 347 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2022.3182133 DO https://doi.org/10.1109/tdmr.2022.3182133 SF ELIB - SuUB Bremen
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