I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Implication of Self-Heating Effect on Device Reliability Ch..:
Chohan, Talha
;
Zhao, Zhixing
;
Lehmann, Steffen
...
IEEE Transactions on Device and Materials Reliability. 22 (2022) 3 - p. 387-395 , 2022
Link:
https://doi.org/10.1109/tdmr.2022.3183630
RT Journal T1 <Title>Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2022.3183630&Exemplar=1&LAN=DE A1 Chohan, Talha A1 Zhao, Zhixing A1 Lehmann, Steffen A1 Arfaoui, Wafa A1 Bossu, Germain A1 Trommer, Jens A1 Slesazeck, Stefan A1 Mikolajick, Thomas A1 Siddabathula, Mahesh PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 22 IS 3 SP 387 OP 395 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2022.3183630 DO https://doi.org/10.1109/tdmr.2022.3183630 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
