I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Negative Bias-Temperature Instabilities and Low-Frequency N..:

Luo, Xuyi ; Zhang, En Xia ; Wang, Peng Fei...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  1 - p. 153-161 , 2023
Link: https://doi.org/10.1109/tdmr.2023.3240976