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1 Ergebnisse
1
On-Chip Heater Design and Control Methodology for Reliabili..:
Yu, Hanzhao
;
Yi, Yong Hyeon
;
Pande, Nakul
.
IEEE Transactions on Device and Materials Reliability. 23 (2023) 2 - p. 233-240 , 2023
Link:
https://doi.org/10.1109/tdmr.2023.3249050
RT Journal T1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2023.3249050&Exemplar=1&LAN=DE A1 Yu, Hanzhao A1 Yi, Yong Hyeon A1 Pande, Nakul A1 Kim, Chris H. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 23 IS 2 SP 233 OP 240 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2023.3249050 DO https://doi.org/10.1109/tdmr.2023.3249050 SF ELIB - SuUB Bremen
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