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Reliability of VO textsubscript 2-Based mmWave Switches Und..:

Chen, Shangyi ; Lust, Mark ; Roo, Annie.
IEEE Transactions on Device and Materials Reliability.  23 (2023)  2 - p. 241-248 , 2023
Link: https://doi.org/10.1109/tdmr.2023.3249771