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1 Ergebnisse
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Process-Voltage-Temperature Variations Assessment in Energy..:
Rizzi, Tommaso
;
Baroni, Andrea
;
Glukhov, Artem
...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 3 - p. 328-336 , 2023
Link:
https://doi.org/10.1109/tdmr.2023.3259015
RT Journal T1 <Title>Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2023.3259015&Exemplar=1&LAN=DE A1 Rizzi, Tommaso A1 Baroni, Andrea A1 Glukhov, Artem A1 Bertozzi, Davide A1 Wenger, Christian A1 Ielmini, Daniele A1 Zambelli, Cristian PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 23 IS 3 SP 328 OP 336 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2023.3259015 DO https://doi.org/10.1109/tdmr.2023.3259015 SF ELIB - SuUB Bremen
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