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1 Ergebnisse
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A Method Adopting Aging Corner to Improve the Accuracy of D..:
Sang, Qianqian
;
Yang, Xinhuan
;
Zhang, Jianyu
...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 3 - p. 436-441 , 2023
Link:
https://doi.org/10.1109/tdmr.2023.3304280
RT Journal T1 <Title>A Method Adopting Aging Corner to Improve the Accuracy of Device Aging Simulation Model</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2023.3304280&Exemplar=1&LAN=DE A1 Sang, Qianqian A1 Yang, Xinhuan A1 Zhang, Jianyu A1 Wang, Chuanzheng A1 Yu, Mingyan A1 Zhao, Yuanfu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 23 IS 3 SP 436 OP 441 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2023.3304280 DO https://doi.org/10.1109/tdmr.2023.3304280 SF ELIB - SuUB Bremen
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