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Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-..:

Zagni, Nicolò ; Gao, Veronica Zhan ; Verzellesi, Giovanni...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 453-460 , 2023
Link: https://doi.org/10.1109/tdmr.2023.3305033