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1 Ergebnisse
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Characterization of LDO Induced Increment of SEE Sensitivit..:
Cai, Chang
;
Liu, Yuzhu
;
Hu, Minchi
..
IEEE Transactions on Device and Materials Reliability. 23 (2023) 4 - p. 537-543 , 2023
Link:
https://doi.org/10.1109/tdmr.2023.3316625
RT Journal T1 <Title>Characterization of LDO Induced Increment of SEE Sensitivity for 22-nm FDSOI SRAM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2023.3316625&Exemplar=1&LAN=DE A1 Cai, Chang A1 Liu, Yuzhu A1 Hu, Minchi A1 Chen, Gengshen A1 Yu, Jun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 23 IS 4 SP 537 OP 543 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2023.3316625 DO https://doi.org/10.1109/tdmr.2023.3316625 SF ELIB - SuUB Bremen
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