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Measurements and Review of Failure Mechanisms and Reliabili..:
Yu, Renze
;
Jahdi, Saeed
;
Alatise, Olayiwola
...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 4 - p. 544-563 , 2023
Link:
https://doi.org/10.1109/tdmr.2023.3316928
RT Journal T1 <Title>Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2023.3316928&Exemplar=1&LAN=DE A1 Yu, Renze A1 Jahdi, Saeed A1 Alatise, Olayiwola A1 Ortiz-Gonzalez, Jose A1 Munagala, Sai Priya A1 Simpson, Nick A1 Mellor, Phil PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 23 IS 4 SP 544 OP 563 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2023.3316928 DO https://doi.org/10.1109/tdmr.2023.3316928 SF ELIB - SuUB Bremen
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