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1 Ergebnisse
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A Source Segmented LDMOS Structure for Improving Single Eve..:
Xu, Jiang
;
Lei, Zeyu
;
Zhang, Chenchen
..
IEEE Transactions on Device and Materials Reliability. 24 (2024) 1 - p. 105-111 , 2024
Link:
https://doi.org/10.1109/tdmr.2024.3349621
RT Journal T1 <Title>A Source Segmented LDMOS Structure for Improving Single Event Burnout Tolerance Based on High-Voltage BCD Process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2024.3349621&Exemplar=1&LAN=DE A1 Xu, Jiang A1 Lei, Zeyu A1 Zhang, Chenchen A1 Wan, Xin A1 Chen, Zhuojun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 24 IS 1 SP 105 OP 111 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2024.3349621 DO https://doi.org/10.1109/tdmr.2024.3349621 SF ELIB - SuUB Bremen
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