I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Characterization and Modeling of Hot Carrier Degradation Un..:
Chen, Yanning
;
Wang, Kai
;
Shao, Jin
...
IEEE Transactions on Device and Materials Reliability. 24 (2024) 1 - p. 123-128 , 2024
Link:
https://doi.org/10.1109/tdmr.2024.3359187
RT Journal T1 <Title>Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2024.3359187&Exemplar=1&LAN=DE A1 Chen, Yanning A1 Wang, Kai A1 Shao, Jin A1 Liu, Fang A1 Yang, Xinhuan A1 Zhang, Jianyu A1 Sang, Qianqian A1 Wang, Chuanzheng A1 Zhao, Yuanfu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 24 IS 1 SP 123 OP 128 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2024.3359187 DO https://doi.org/10.1109/tdmr.2024.3359187 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
