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1 Ergebnisse
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Universal Dielectric Breakdown Modeling Under Off-State TDD..:
Garba-Seybou, Tidjani
;
Bravaix, Alain
;
Federspiel, Xavier
...
IEEE Transactions on Device and Materials Reliability. 24 (2024) 2 - p. 174-183 , 2024
Link:
https://doi.org/10.1109/tdmr.2024.3387271
RT Journal T1 <Title>Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2024.3387271&Exemplar=1&LAN=DE A1 Garba-Seybou, Tidjani A1 Bravaix, Alain A1 Federspiel, Xavier A1 Hai, Joycelyn A1 Diouf, Cheikh A1 Cacho, Florian PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 24 IS 2 SP 174 OP 183 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2024.3387271 DO https://doi.org/10.1109/tdmr.2024.3387271 SF ELIB - SuUB Bremen
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