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1 Ergebnisse
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Aging Reliability Compact Modeling of Trap Effects in Power..:
Ma, Yanfeng
;
Li, Sheng
;
Liu, Mengli
...
IEEE Transactions on Device and Materials Reliability. 24 (2024) 2 - p. 313-322 , 2024
Link:
https://doi.org/10.1109/tdmr.2024.3387573
RT Journal T1 <Title>Aging Reliability Compact Modeling of Trap Effects in Power GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdmr.2024.3387573&Exemplar=1&LAN=DE A1 Ma, Yanfeng A1 Li, Sheng A1 Liu, Mengli A1 Lu, Weihao A1 Li, Mingfei A1 Liu, Siyang A1 Zhang, Long A1 Wei, Jiaxing A1 Yang, Lanlan A1 Sun, Weifeng A1 Sun, Jiaxin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1530-4388 SN 1558-2574 JF IEEE Transactions on Device and Materials Reliability VO 24 IS 2 SP 313 OP 322 LK http://dx.doi.org/https://doi.org/10.1109/tdmr.2024.3387573 DO https://doi.org/10.1109/tdmr.2024.3387573 SF ELIB - SuUB Bremen
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