I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
On Tracing Screen Photos – A Moiré Pattern-Based Approach:
Xu, Wenyuan
;
Cheng, Yushi
;
Ji, Xiaoyu
.
IEEE Transactions on Dependable and Secure Computing. 21 (2024) 4 - p. 2068-2084 , 2024
Link:
https://doi.org/10.1109/tdsc.2023.3299983
RT Journal T1 <Title>On Tracing Screen Photos – A Moiré Pattern-Based Approach</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdsc.2023.3299983&Exemplar=1&LAN=DE A1 Xu, Wenyuan A1 Cheng, Yushi A1 Ji, Xiaoyu A1 Chen, Yi-Chao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1545-5971 SN 1941-0018 SN 2160-9209 JF IEEE Transactions on Dependable and Secure Computing VO 21 IS 4 SP 2068 OP 2084 LK http://dx.doi.org/https://doi.org/10.1109/tdsc.2023.3299983 DO https://doi.org/10.1109/tdsc.2023.3299983 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
