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1 Ergebnisse
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An Empirical Study on the Insecurity of End-of-Life (EoL) I..:
Wang, Dingding
;
Jiang, Muhui
;
Chang, Rui
...
IEEE Transactions on Dependable and Secure Computing. 21 (2024) 4 - p. 3501-3514 , 2024
Link:
https://doi.org/10.1109/tdsc.2023.3334017
RT Journal T1 <Title>An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tdsc.2023.3334017&Exemplar=1&LAN=DE A1 Wang, Dingding A1 Jiang, Muhui A1 Chang, Rui A1 Zhou, Yajin A1 Wang, Hexiang A1 Hou, Baolei A1 Wu, Lei A1 Luo, Xiapu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1545-5971 SN 1941-0018 SN 2160-9209 JF IEEE Transactions on Dependable and Secure Computing VO 21 IS 4 SP 3501 OP 3514 LK http://dx.doi.org/https://doi.org/10.1109/tdsc.2023.3334017 DO https://doi.org/10.1109/tdsc.2023.3334017 SF ELIB - SuUB Bremen
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