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1 Ergebnisse
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Parasitic Gate Resistance Impact on Triple-Gate FinFET CMOS..:
Solis Avila, Edgar
;
Tinoco, Julio C.
;
Martinez-Lopez, Andrea G.
...
IEEE Transactions on Electron Devices. 63 (2016) 7 - p. 2635-2642 , 2016
Link:
https://doi.org/10.1109/ted.2016.2558580
RT Journal T1
Parasitic Gate Resistance Impact on Triple-Gate FinFET CMOS Inverter
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2016.2558580&Exemplar=1&LAN=DE A1 Solis Avila, Edgar A1 Tinoco, Julio C. A1 Martinez-Lopez, Andrea G. A1 Reyes-Barranca, Mario Alfredo A1 Cerdeira, Antonio A1 Raskin, Jean-Pierre PB Institute of Electrical and Electronics Engineers (IEEE) YR 2016 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 63 IS 7 SP 2635 OP 2642 LK http://dx.doi.org/https://doi.org/10.1109/ted.2016.2558580 DO https://doi.org/10.1109/ted.2016.2558580 SF ELIB - SuUB Bremen
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