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1 Ergebnisse
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Mixed Hot-Carrier/Bias Temperature Instability Degradation ..:
Jech, Markus
;
Rott, Gunnar
;
Reisinger, Hans
...
IEEE Transactions on Electron Devices. 67 (2020) 8 - p. 3315-3322 , 2020
Link:
https://doi.org/10.1109/ted.2020.3000749
RT Journal T1 <Title>Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and Peculiarities</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2020.3000749&Exemplar=1&LAN=DE A1 Jech, Markus A1 Rott, Gunnar A1 Reisinger, Hans A1 Tyaginov, Stanislav A1 Rzepa, Gerhard A1 Grill, Alexander A1 Jabs, Dominic A1 Jungemann, Christoph A1 Waltl, Michael A1 Grasser, Tibor PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 67 IS 8 SP 3315 OP 3322 LK http://dx.doi.org/https://doi.org/10.1109/ted.2020.3000749 DO https://doi.org/10.1109/ted.2020.3000749 SF ELIB - SuUB Bremen
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