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Impact of Dummy Gate Removal and a Silicon Cap on the Low-F..:

Xie, Duan ; Simoen, Eddy ; Chen, Haifeng..
IEEE Transactions on Electron Devices.  67 (2020)  11 - p. 4713-4719 , 2020
Link: https://doi.org/10.1109/ted.2020.3019366