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1 Ergebnisse
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1.2-kV Vertical GaN Fin-JFETs: High-Temperature Characteris..:
Liu, Jingcun
;
Xiao, Ming
;
Zhang, Ruizhe
...
IEEE Transactions on Electron Devices. 68 (2021) 4 - p. 2025-2032 , 2021
Link:
https://doi.org/10.1109/ted.2021.3059192
RT Journal T1 <Title>1.2-kV Vertical GaN Fin-JFETs: High-Temperature Characteristics and Avalanche Capability</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2021.3059192&Exemplar=1&LAN=DE A1 Liu, Jingcun A1 Xiao, Ming A1 Zhang, Ruizhe A1 Pidaparthi, Subhash A1 Cui, Hao A1 Edwards, Andrew A1 Craven, Michael A1 Baubutr, Lek A1 Drowley, Cliff A1 Zhang, Yuhao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 68 IS 4 SP 2025 OP 2032 LK http://dx.doi.org/https://doi.org/10.1109/ted.2021.3059192 DO https://doi.org/10.1109/ted.2021.3059192 SF ELIB - SuUB Bremen
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