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1 Ergebnisse
1
A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image S..:
Shike, Hiroya
;
Kuroda, Rihito
;
Kobayashi, Ryota
...
IEEE Transactions on Electron Devices. 68 (2021) 4 - p. 2056-2063 , 2021
Link:
https://doi.org/10.1109/ted.2021.3062576
RT Journal T1
A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image Sensor With Backside- Illuminated Pinned Photodiode, Two-Stage Lateral Overflow Integration Capacitor, and Voltage Domain Memory Bank
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2021.3062576&Exemplar=1&LAN=DE A1 Shike, Hiroya A1 Kuroda, Rihito A1 Kobayashi, Ryota A1 Murata, Maasa A1 Fujihara, Yasuyuki A1 Suzuki, Manabu A1 Harada, Shoma A1 Shibaguchi, Taku A1 Kuriyama, Naoya A1 Hatsui, Takaki A1 Miyawaki, Jun A1 Harada, Tetsuo A1 Yamasaki, Yuichi A1 Watanabe, Takeo A1 Harada, Yoshihisa A1 Sugawa, Shigetoshi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 68 IS 4 SP 2056 OP 2063 LK http://dx.doi.org/https://doi.org/10.1109/ted.2021.3062576 DO https://doi.org/10.1109/ted.2021.3062576 SF ELIB - SuUB Bremen
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