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1 Ergebnisse
1
Total-Ionizing-Dose Radiation-Induced Dual-Channel Leakage ..:
Zhou, Xin
;
Li, Zhixuan
;
Yuan, Zhangyi'an
...
IEEE Transactions on Electron Devices. 68 (2021) 6 - p. 2861-2866 , 2021
Link:
https://doi.org/10.1109/ted.2021.3072019
RT Journal T1 <Title>Total-Ionizing-Dose Radiation-Induced Dual-Channel Leakage Current at Unclosed Edge Termination for High Voltage SOI LDMOS</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2021.3072019&Exemplar=1&LAN=DE A1 Zhou, Xin A1 Li, Zhixuan A1 Yuan, Zhangyi'an A1 Wang, Ruidi A1 Shu, Lei A1 Wang, Tianqi A1 Qiao, Ming A1 Wang, Zhuo A1 Li, Zhaoji A1 Zhang, Bo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 68 IS 6 SP 2861 OP 2866 LK http://dx.doi.org/https://doi.org/10.1109/ted.2021.3072019 DO https://doi.org/10.1109/ted.2021.3072019 SF ELIB - SuUB Bremen
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