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Simulation Study of Single-Event Effects for the 4H-SiC VDM..:

Zhou, Jian-Cheng ; Wang, Ying ; Li, Xing-Ji...
IEEE Transactions on Electron Devices.  69 (2022)  6 - p. 3283-3289 , 2022
Link: https://doi.org/10.1109/ted.2022.3166122