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Charge-Trapping-Induced Compensation of the Ferroelectric P..:

Fontanini, R. ; Segatto, M. ; Nair, K. S....
IEEE Transactions on Electron Devices.  69 (2022)  7 - p. 3694-3699 , 2022
Link: https://doi.org/10.1109/ted.2022.3175684