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Understanding the Origin of Unreliable Low-Resistance State..:
Duan, Yiwei
;
Gao, Haixia
;
Sun, Yuxin
...
IEEE Transactions on Electron Devices. 69 (2022) 11 - p. 6369-6375 , 2022
Link:
https://doi.org/10.1109/ted.2022.3188601
RT Journal T1 <Title>Understanding the Origin of Unreliable Low-Resistance State During Initialization Process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3188601&Exemplar=1&LAN=DE A1 Duan, Yiwei A1 Gao, Haixia A1 Sun, Yuxin A1 Wu, Shuliang A1 Qian, Mengyi A1 Guo, Jingshu A1 Yang, Mei A1 Ma, Xiaohua A1 Yang, Yintang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 11 SP 6369 OP 6375 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3188601 DO https://doi.org/10.1109/ted.2022.3188601 SF ELIB - SuUB Bremen
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