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1 Ergebnisse
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Junction Engineering-Based Modeling and Optimization of Dee..:
Lee, Haewon
;
Choi, Hyejeong
;
Yun, Ilgu
IEEE Transactions on Electron Devices. 69 (2022) 9 - p. 4970-4975 , 2022
Link:
https://doi.org/10.1109/ted.2022.3190262
RT Journal T1 <Title>Junction Engineering-Based Modeling and Optimization of Deep Junction Silicon Single-Photon Avalanche Diodes for Device Scaling</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3190262&Exemplar=1&LAN=DE A1 Lee, Haewon A1 Choi, Hyejeong A1 Yun, Ilgu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 9 SP 4970 OP 4975 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3190262 DO https://doi.org/10.1109/ted.2022.3190262 SF ELIB - SuUB Bremen
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