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Experimental Validation of a Compact Pinhole Latent Defect ..:
Gomez, Jhon
;
Xama, Nektar
;
Lootens, Dirk
...
IEEE Transactions on Electron Devices. 69 (2022) 9 - p. 4796-4802 , 2022
Link:
https://doi.org/10.1109/ted.2022.3191990
RT Journal T1 <Title>Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3191990&Exemplar=1&LAN=DE A1 Gomez, Jhon A1 Xama, Nektar A1 Lootens, Dirk A1 Coyette, Anthony A1 Vanhooren, Ronny A1 Dobbelaere, Wim A1 Gielen, Georges PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 9 SP 4796 OP 4802 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3191990 DO https://doi.org/10.1109/ted.2022.3191990 SF ELIB - SuUB Bremen
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