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1 Ergebnisse
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Unclamped Inductive Switching Robustness of SiC Devices Wit..:
Saito, Wataru
;
Lou, Zaiqi
;
NIshizawa, Shin-Ichi
IEEE Transactions on Electron Devices. 69 (2022) 10 - p. 5671-5677 , 2022
Link:
https://doi.org/10.1109/ted.2022.3200637
RT Journal T1 <Title>Unclamped Inductive Switching Robustness of SiC Devices With Parallel-Connected Varistor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3200637&Exemplar=1&LAN=DE A1 Saito, Wataru A1 Lou, Zaiqi A1 NIshizawa, Shin-Ichi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 10 SP 5671 OP 5677 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3200637 DO https://doi.org/10.1109/ted.2022.3200637 SF ELIB - SuUB Bremen
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