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1 Ergebnisse
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Grain Size Engineering Using Amorphous-Ge/Si Stack to Enhan..:
Lee, Tae In
;
Kim, Min Ju
;
Shin, Eui Joong
...
IEEE Transactions on Electron Devices. 69 (2022) 10 - p. 5940-5943 , 2022
Link:
https://doi.org/10.1109/ted.2022.3201779
RT Journal T1 <Title>Grain Size Engineering Using Amorphous-Ge/Si Stack to Enhance Channel Mobility for NAND Flash Memory</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3201779&Exemplar=1&LAN=DE A1 Lee, Tae In A1 Kim, Min Ju A1 Shin, Eui Joong A1 Lee, Gyusoup A1 Jeong, Jaejoong A1 Lee, Yun Hee A1 Lee, Jung Hoon A1 Lee, Jaeduk A1 Cho, Byung Jin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 10 SP 5940 OP 5943 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3201779 DO https://doi.org/10.1109/ted.2022.3201779 SF ELIB - SuUB Bremen
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