I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Layout Optimization of Complementary FET 6T-SRAM Cell Based..:
Luo, Yanna
;
Cao, Lei
;
Zhang, Qingzhu
...
IEEE Transactions on Electron Devices. 69 (2022) 11 - p. 6095-6101 , 2022
Link:
https://doi.org/10.1109/ted.2022.3207972
RT Journal T1 <Title>Layout Optimization of Complementary FET 6T-SRAM Cell Based on a Universal Methodology Using Sensitivity With Respect to Parasitic - and -Values</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3207972&Exemplar=1&LAN=DE A1 Luo, Yanna A1 Cao, Lei A1 Zhang, Qingzhu A1 Cao, Yu A1 Zhang, Zhaohao A1 Yao, Jiaxin A1 Yan, Gangping A1 Zhang, Xuexiang A1 Gan, Weizhuo A1 Huo, Jiali A1 Xu, Haoqing A1 Tian, Guoliang A1 Bu, Weihai A1 Wu, Yongqin A1 Wu, Zhenhua A1 Yin, Huaxiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 11 SP 6095 OP 6101 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3207972 DO https://doi.org/10.1109/ted.2022.3207972 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
