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Reliability Improvement of Gate-All-Around Junctionless SON..:
Lee, Jung-Woo
;
Han, Joon-Kyu
;
Kim, Myung-Su
...
IEEE Transactions on Electron Devices. 69 (2022) 11 - p. 6133-6138 , 2022
Link:
https://doi.org/10.1109/ted.2022.3209646
RT Journal T1 <Title>Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3209646&Exemplar=1&LAN=DE A1 Lee, Jung-Woo A1 Han, Joon-Kyu A1 Kim, Myung-Su A1 Yu, Ji-Man A1 Jung, Jin-Woo A1 Yun, Seong-Yun A1 Choi, Yang-Kyu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 69 IS 11 SP 6133 OP 6138 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3209646 DO https://doi.org/10.1109/ted.2022.3209646 SF ELIB - SuUB Bremen
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