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1 Ergebnisse
1
Investigation of the Progressive Gate Breakdown Behaviors i..:
Chao, Xin
;
Tang, Chengkang
;
Tan, Jingjing
...
IEEE Transactions on Electron Devices. 70 (2023) 1 - p. 25-30 , 2023
Link:
https://doi.org/10.1109/ted.2022.3220498
RT Journal T1
Investigation of the Progressive Gate Breakdown Behaviors in p-GaN Gate HEMTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3220498&Exemplar=1&LAN=DE A1 Chao, Xin A1 Tang, Chengkang A1 Tan, Jingjing A1 Wang, Chen A1 Sun, QingQing A1 Zhang, David Wei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 1 SP 25 OP 30 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3220498 DO https://doi.org/10.1109/ted.2022.3220498 SF ELIB - SuUB Bremen
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