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1 Ergebnisse
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Resistive Switching Characteristics of HfO x-Based Memristo..:
Liang, Hua-Nan
;
Bai, Na
;
Zou, Lan-Qing
...
IEEE Transactions on Electron Devices. 70 (2023) 1 - p. 83-87 , 2023
Link:
https://doi.org/10.1109/ted.2022.3225123
RT Journal T1 <Title>Resistive Switching Characteristics of HfO x-Based Memristor by Inserting GeTe Layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3225123&Exemplar=1&LAN=DE A1 Liang, Hua-Nan A1 Bai, Na A1 Zou, Lan-Qing A1 Sun, Hua-Jun A1 Xue, Kan-Hao A1 Cheng, Wei-Ming A1 Lu, Hong A1 Miao, Xiang-Shui PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 1 SP 83 OP 87 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3225123 DO https://doi.org/10.1109/ted.2022.3225123 SF ELIB - SuUB Bremen
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