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1 Ergebnisse
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Electrical Characterization of Plasma-Assisted Electron Bea..:
Abhishek, Anand
;
Kumar, Niraj
;
Vishant
...
IEEE Transactions on Electron Devices. 70 (2023) 2 - p. 771-775 , 2023
Link:
https://doi.org/10.1109/ted.2022.3231574
RT Journal T1 <Title>Electrical Characterization of Plasma-Assisted Electron Beam Source With Sub-mm Sheet Aperture</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2022.3231574&Exemplar=1&LAN=DE A1 Abhishek, Anand A1 Kumar, Niraj A1 Vishant A1 Meena, Bharat Lal A1 Jain, Sahil A1 Prabhu, Shriganesh A1 Mishra, Ajay A1 Dixit, Nimish A1 Khare, Sudhir PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 2 SP 771 OP 775 LK http://dx.doi.org/https://doi.org/10.1109/ted.2022.3231574 DO https://doi.org/10.1109/ted.2022.3231574 SF ELIB - SuUB Bremen
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