I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Modeling Irradiation-Induced Degradation for 4H-SiC Power M..:

Liang, Shiwei ; Yang, Yu ; Shu, Lei...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1176-1180 , 2023
Link: https://doi.org/10.1109/ted.2023.3234039