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1 Ergebnisse
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A 280-μ V Temporal Noise, 76-dB Dynamic Range CMOS Image Se..:
Jainwal, Kapil
;
Sarkar, Mukul
IEEE Transactions on Electron Devices. 70 (2023) 3 - p. 1134-1142 , 2023
Link:
https://doi.org/10.1109/ted.2023.3236911
RT Journal T1 <Title>A 280-μ V Temporal Noise, 76-dB Dynamic Range CMOS Image Sensor With an In-Pixel Chopping-Based Low-Frequency Noise Reduction Technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3236911&Exemplar=1&LAN=DE A1 Jainwal, Kapil A1 Sarkar, Mukul PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 3 SP 1134 OP 1142 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3236911 DO https://doi.org/10.1109/ted.2023.3236911 SF ELIB - SuUB Bremen
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