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A Study on the Performance of AlGaN/GaN HEMTs Regrown on Mg..:
Döring, Philipp
;
Sinnwell, Matthias
;
Müller, Stefan
...
IEEE Transactions on Electron Devices. 70 (2023) 3 - p. 947-952 , 2023
Link:
https://doi.org/10.1109/ted.2023.3237803
RT Journal T1
A Study on the Performance of AlGaN/GaN HEMTs Regrown on Mg-Implanted GaN Layers With Low Channel Thickness
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3237803&Exemplar=1&LAN=DE A1 Döring, Philipp A1 Sinnwell, Matthias A1 Müller, Stefan A1 Czap, Heiko A1 Driad, Rachid A1 Brückner, Peter A1 Kohler, Klaus A1 Kirste, Lutz A1 Mikulla, Michael A1 Quay, Rüdiger PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 3 SP 947 OP 952 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3237803 DO https://doi.org/10.1109/ted.2023.3237803 SF ELIB - SuUB Bremen
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